The HI-SCAN 5180si is a high-resolution airport check-in X-ray baggage inspection system designed for detailed checked-baggage screening. It features a 517 × 800 mm tunnel, up to 37 mm typical steel penetration, wire detectability up to 40 AWG, a 160 kV X-ray generator and 100% duty-cycle operation. The system is suitable for airports, aviation security, baggage screening and other demanding security environments.
In an industry first, Raman chemical substance Identification meets trace explosive and drug Detection to give users unparalleled screening capability. Security made simple Best